Open AccessReview of Leakage Power Reduction in CMOS Circuits
Author(s) -
Khushboo Kumari,
Arun Agarwal,
J Jayvrat,
Kabita Agarwal
Publication year - 2014
Publication title -
american journal of electrical and electronic engineering
Language(s) - English
Resource type - Journals
eISSN - 2328-7365
pISSN - 2328-7357
DOI - 10.12691/ajeee-2-4-2
Subject(s) - cmos , leakage (economics) , wireless , electrical engineering , electronic circuit , chip , electronic engineering , subthreshold conduction , engineering , dynamic demand , computer science , embedded system , transistor , telecommunications , power (physics) , voltage , economics , macroeconomics , physics , quantum mechanics
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