Open AccessDepth Profiling of Ultra Thin Film Using Laser Induced Fluorescence Spectroscopy under Normal Incidence Conditions Based on the Reciprocal Principle
Author(s) -
XingZheng Wu,
Takehiko Kitamori,
Norio Teramae,
Tsuguo Sawada
Publication year - 1991
Publication title -
bulletin of the chemical society of japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.145
H-Index - 99
eISSN - 1348-0634
pISSN - 0009-2673
DOI - 10.1246/bcsj.64.755
Subject(s) - chemistry , thin film , wavelength , analytical chemistry (journal) , optics , laser , spectroscopy , excitation , materials science , chromatography , nanotechnology , physics , quantum mechanics , electrical engineering , engineering
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