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Thickness Measurement of Surface Layer by the Angular Dependent X-Ray Photoelectron Spectroscopy
Author(s) -
Masamichi Yamada,
Haruo Kuroda
Publication year - 1980
Publication title -
bulletin of the chemical society of japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.145
H-Index - 99
eISSN - 1348-0634
pISSN - 0009-2673
DOI - 10.1246/bcsj.53.2159
Subject(s) - chemistry , x ray photoelectron spectroscopy , layer (electronics) , surface layer , spectroscopy , x ray , surface (topology) , analytical chemistry (journal) , nuclear magnetic resonance , optics , organic chemistry , geometry , physics , astronomy , mathematics

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