Open AccessEXAFS and XRD Characterization of Iron Thin Films Prepared by Sputtering at Very Low Temperatures
Author(s) -
F. JimnezVillacorta,
A. MuozMartn,
M. Vila,
C. Prieto,
A. Traverse
Publication year - 2005
Publication title -
physica scripta
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.415
H-Index - 83
eISSN - 1402-4896
pISSN - 0031-8949
DOI - 10.1238/physica.topical.115a00450
Subject(s) - materials science , extended x ray absorption fine structure , sputtering , characterization (materials science) , thin film , analytical chemistry (journal) , nanotechnology , optics , absorption spectroscopy , physics , chemistry , chromatography