
Temperature Dependence of Local Structure of Ge Impurity in Si 001 Thin Film Probed by MultipleScattering XAFS
Author(s) -
Shiqiang Wei,
Zheng Sun,
H. Ōyanagi,
Wenjie Zhong,
Dongliang Chen
Publication year - 2005
Publication title -
physica scripta
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.415
H-Index - 83
eISSN - 1402-4896
pISSN - 0031-8949
DOI - 10.1238/physica.topical.115a00140
Subject(s) - x ray absorption fine structure , materials science , impurity , condensed matter physics , thin film , local structure , nanotechnology , chemical physics , chemistry , spectroscopy , physics , quantum mechanics , organic chemistry