Open AccessSecondary Electron/Reflected Particle Coincidence Studies during Slow Highly Charged Ion-Surface Interactions
Author(s) -
Caith Thomas McGrath,
Zoltán Szilágyi,
M B Shah,
R W McCullough,
J. M. Woolsey,
R. Trassl,
E. Salzborn
Publication year - 2001
Publication title -
physica scripta
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.415
H-Index - 83
eISSN - 1402-4896
pISSN - 0031-8949
DOI - 10.1238/physica.topical.092a00040
Subject(s) - coincidence , ion , atomic physics , kinetic energy , electron , secondary emission , aluminium , crystallite , highly charged ion , charged particle , secondary electrons , physics , particle (ecology) , materials science , nuclear physics , ion source , medicine , oceanography , alternative medicine , pathology , quantum mechanics , geology , metallurgy
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