Open AccessCharacterisation of n-InP/n-GaAs Wafer Fused Heterojunctions
Author(s) -
Jonas Bentell,
F Frans Wennekes,
F. Salomonsson,
M. Hammar,
K. Streubel
Publication year - 1999
Publication title -
physica scripta
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.415
H-Index - 83
eISSN - 1402-4896
pISSN - 0031-8949
DOI - 10.1238/physica.topical.079a00206
Subject(s) - materials science , doping , ohmic contact , heterojunction , secondary ion mass spectrometry , impurity , secondary ion mass spectroscopy , wafer , optoelectronics , analytical chemistry (journal) , conductivity , redistribution (election) , electrical resistivity and conductivity , equivalent series resistance , ion , voltage , silicon , nanotechnology , chemistry , electrical engineering , organic chemistry , layer (electronics) , chromatography , engineering , politics , political science , law