Engineering the Complex-Valued Constitutive Parameters of Metamaterials for Perfect Absorption
Author(s) -
Pengwei Wang,
Naibo Chen,
Chaojun Tang,
Jing Chen,
Fanxin Liu,
Saiqian Sheng,
Bo Yan,
Chenghua Sui
Publication year - 2017
Publication title -
nanoscale research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.87
H-Index - 107
eISSN - 1931-7573
pISSN - 1556-276X
DOI - 10.1186/s11671-017-2048-2
Subject(s) - metamaterial , materials science , refractive index , permittivity , wavelength , optics , amorphous solid , molar absorptivity , electromagnetic radiation , reflection coefficient , optoelectronics , dielectric , physics , chemistry , organic chemistry
We theoretically studied how to directly engineer the constitutive parameters of metamaterials for perfect absorbers of electromagnetic waves. As an example, we numerically investigated the necessary refractive index n and extinction coefficient k and the relative permittivity ε and permeability μ of a metamaterial anti-reflection layer, which could cancel the reflection from a hydrogenated amorphous silicon (α-Si:H) thin film on a metal substrate, within the visible wavelength range from 300 to 800 nm. We found that the metamaterial anti-reflection layer should have a negative refractive index ( n < 0) for short-wavelength visible light but have a positive refractive index ( n > 0) for long-wavelength visible light. The relative permittivity ε and permeability μ could be fitted by the Lorentz model, which exhibited electric and magnetic resonances, respectively.
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