Combining scanning probe microscopy and x-ray spectroscopy | Zendy

C. Fauquet | Zendy; Maël Dehlinger | Zendy; Franck Jandard | Zendy; S. Ferrero | Zendy; D. Pailharey | Zendy; Sylvia Larcheri | Zendy; R. Graziola | Zendy; J. Purāns | Zendy; A. Bjeoumikhov | Zendy; A. Erko | Zendy; Ivo Žižak | Zendy; B. Dahmani | Zendy; D. Tonneau | Zendy

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Combining scanning probe microscopy and x-ray spectroscopy

Author(s) -

C. Fauquet,

Maël Dehlinger,

Franck Jandard,

S. Ferrero,

D. Pailharey,

Sylvia Larcheri,

R. Graziola,

J. Purāns,

A. Bjeoumikhov,

A. Erko,

Ivo Žižak,

B. Dahmani,

D. Tonneau

Publication year - 2011

Publication title -

nanoscale research letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.87

H-Index - 107

eISSN - 1931-7573

pISSN - 1556-276X

DOI - 10.1186/1556-276x-6-308

Subject(s) - microscopy , materials science , spectroscopy , scanning probe microscopy , scanning confocal electron microscopy , optics , nanotechnology , physics , astronomy

A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO 4 thin layers are in perfect agreement with that obtained with other conventional techniques. Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown. Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample. Preliminary results on Co-Ti sample analysis are presented.

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