Open AccessThree-Dimensional Analysis of Peeled Internal Limiting Membrane Using Focused Ion Beam/Scanning Electron Microscopy
Author(s) -
Akira Hirata,
Kazuhisa Murata,
Ken Hayashi,
Keiichiro Nakamura
Publication year - 2018
Publication title -
translational vision science and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.508
H-Index - 21
ISSN - 2164-2591
DOI - 10.1167/tvst.7.1.15
Subject(s) - internal limiting membrane , epiretinal membrane , membrane , scanning electron microscope , macular hole , vitrectomy , cell membrane , inner limiting membrane , retinal , focused ion beam , biophysics , chemistry , membrane structure , materials science , analytical chemistry (journal) , chromatography , ophthalmology , ion , biology , medicine , biochemistry , composite material , visual acuity , organic chemistry
FIB/SEM was a useful tool for three-dimensional quantitative analysis of the internal limiting membrane.
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