Open AccessCost Effective Method to Locate the Vulnerable Nodes of Circuits Against the Electrical Fast Transients
Author(s) -
Behnam Gholamrezazadeh Family
Publication year - 2015
Publication title -
journal of electrical and electronic engineering
Language(s) - English
Resource type - Journals
eISSN - 2329-1613
pISSN - 2329-1605
DOI - 10.11648/j.jeee.s.2015030201.26
Subject(s) - electronic circuit , computer science , inductor , point (geometry) , voltage , electronic engineering , power (physics) , electrical engineering , engineering , physics , geometry , mathematics , quantum mechanics
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