Open AccessA Compact Model of Mosfet Transistors Including Dispersion and Thermal Phenomena
Author(s) -
M.A. Belaïd
Publication year - 2015
Publication title -
journal of electrical and electronic engineering
Language(s) - English
Resource type - Journals
eISSN - 2329-1613
pISSN - 2329-1605
DOI - 10.11648/j.jeee.20150306.13
Subject(s) - thermal , transistor , mosfet , reliability (semiconductor) , electronic engineering , dissipation , power semiconductor device , computer science , flexibility (engineering) , chip , power (physics) , materials science , electrical engineering , engineering , physics , voltage , statistics , mathematics , quantum mechanics , meteorology , thermodynamics
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