Open AccessBy-Emitter Emulation of the Degradation of a Calibrated 975 nm Tapered Laser Bar Using a Laser Diode Simulation/Emulation Tool
Author(s) -
Christian Kwaku Amuzuvi
Publication year - 2013
Publication title -
journal of electrical and electronic engineering
Language(s) - English
Resource type - Journals
eISSN - 2329-1613
pISSN - 2329-1605
DOI - 10.11648/j.jeee.20130103.11
Subject(s) - emulation , laser , bar (unit) , degradation (telecommunications) , computer science , diode , solver , materials science , thermal , semiconductor laser theory , laser diode , power (physics) , optoelectronics , electronic engineering , optics , engineering , physics , quantum mechanics , meteorology , economics , programming language , economic growth
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom