Open AccessThe New Software for Research and the Modelling of Grown-in Microdefects in Dislocation-Free Silicon Single Crystals
Author(s) -
V. I. Talanin
Publication year - 2018
Publication title -
engineering and applied sciences
Language(s) - English
Resource type - Journals
eISSN - 2575-2022
pISSN - 2575-1468
DOI - 10.11648/j.eas.20180301.11
Subject(s) - silicon , dislocation , materials science , diffusion , crystallography , software , computer science , optoelectronics , chemistry , physics , composite material , thermodynamics , operating system
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