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Fault Reduction in Nonoscale VLSI Interconnection by Using Carbon Nanotubes Technology
Author(s) -
Behzad Lotfy
Publication year - 2014
Publication title -
science journal of circuits systems and signal processing
Language(s) - English
Resource type - Journals
eISSN - 2326-9073
pISSN - 2326-9065
DOI - 10.11648/j.cssp.20140304.11
Subject(s) - very large scale integration , interconnection , reliability (semiconductor) , carbon nanotube , materials science , nanotechnology , transistor , integrated circuit , computer science , electronic engineering , electrical engineering , engineering , optoelectronics , telecommunications , voltage , physics , power (physics) , quantum mechanics

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