Open AccessSurvey of Low Power Testing of VLSI Circuits
Author(s) -
P. Basker
Publication year - 2013
Publication title -
science journal of circuits systems and signal processing
Language(s) - English
Resource type - Journals
eISSN - 2326-9073
pISSN - 2326-9065
DOI - 10.11648/j.cssp.20130202.15
Subject(s) - reliability engineering , reliability (semiconductor) , power (physics) , computer science , electronic circuit , integrated circuit , dissipation , very large scale integration , power consumption , chip , embedded system , electronic engineering , engineering , electrical engineering , physics , quantum mechanics , thermodynamics
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