Long-Term Complications Related to Biventricular Defibrillator Implantation
Author(s) -
Maurizio Landolina,
Maurizio Gasparini,
Maurizio Lunati,
Saverio Iacopino,
Giuseppe Boriani,
Carlo Bonanno,
Antonello Vado,
Alessandro Proclemer,
Alessandro Capucci,
Chantal Zucchiatti,
Sergio Valsecchi,
Renato Pietro Ricci,
Massimo Santini
Publication year - 2011
Publication title -
circulation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 7.795
H-Index - 607
eISSN - 1524-4539
pISSN - 0009-7322
DOI - 10.1161/circulationaha.110.015024
Subject(s) - medicine , cardiac resynchronization therapy , hazard ratio , confidence interval , fluoroscopy , surgery , cardiology , heart failure , ejection fraction
Long-term data on device-related untoward events in patients receiving defibrillators for resynchronization therapy (CRT-D) are lacking. We quantified the frequency of repeat invasive procedures and the nature of long-term complications in current clinical practice and examined possible predictors of device-related events and their association with long-term patient outcome.
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