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Texture Analysis by the Measurement of Individual Grain Orientations—Electron Microscopical Methods and Application on Dual-Phase Steel
Author(s) -
R. A. Schwarzer,
H. Weiland
Publication year - 1987
Publication title -
texture stress and microstructure
Language(s) - English
Resource type - Journals
eISSN - 1687-5400
pISSN - 1687-5397
DOI - 10.1155/tsm.8-9.551
Subject(s) - dual (grammatical number) , texture (cosmology) , materials science , phase (matter) , electron , crystallography , metallurgy , artificial intelligence , computer science , physics , chemistry , image (mathematics) , nuclear physics , literature , art , quantum mechanics

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