Quantification of Minor Texture Components by Hard X‐Rays | Zendy

Henning Friis Poulsen | Zendy; Dorte Juul Jensen | Zendy; T. Tschentscher | Zendy; L. Wcislak | Zendy; E.M. Lauridsen | Zendy; L. Margulies | Zendy; S. Schmidt | Zendy

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Quantification of Minor Texture Components by Hard X‐Rays

Author(s) -

Henning Friis Poulsen,

Dorte Juul Jensen,

T. Tschentscher,

L. Wcislak,

E.M. Lauridsen,

L. Margulies,

S. Schmidt

Publication year - 2001

Publication title -

texture stress and microstructure

Language(s) - English

Resource type - Journals

eISSN - 1687-5400

pISSN - 1687-5397

DOI - 10.1155/tsm.35.39

Subject(s) - texture (cosmology) , volume fraction , crystallite , materials science , nucleation , diffraction , volume (thermodynamics) , reflection (computer programming) , synchrotron radiation , crystallography , optics , mineralogy , physics , composite material , metallurgy , computer science , chemistry , thermodynamics , image (mathematics) , artificial intelligence , programming language

Non-destructive methods to determine the volume fraction of minor texture components with very low reflection intensities are presented. The methods are based on polycrystalline diffraction of hard X-rays from synchrotron sources. By focusing the X-rays and scanning the specimen, it is shown that volume fractions as low as 10-9 can be registered, provided that the crystallographic orientations of such volume elements are far away from any major texture component. Simultaneously, the spatial resolving power is of the order 0.03 μm3. The relevance of such methods for nucleation studies and trace analysis is outlined.

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