High Temperature Texture Goniometer for in Situ Measurements of Transformation Textures | Zendy

G. Brückner | Zendy; F. Reher | Zendy; Günter Gottstein | Zendy

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High Temperature Texture Goniometer for in Situ Measurements of Transformation Textures

Author(s) -

G. Brückner,

F. Reher,

Günter Gottstein

Publication year - 1998

Publication title -

texture stress and microstructure

Language(s) - English

Resource type - Journals

eISSN - 1687-5400

pISSN - 1687-5397

DOI - 10.1155/tsm.30.125

Subject(s) - goniometer , kapton , materials science , foil method , annealing (glass) , texture (cosmology) , composite material , in situ , optics , polyimide , chemistry , computer science , physics , layer (electronics) , image (mathematics) , artificial intelligence , organic chemistry

A high temperature stage was designed for mounting onto a computer controlled four circle X-ray texture goniometer. This technique allowed to conduct in situ texture measurement, i.e. the determination of the texture evolution during rather than subsequent to annealing. The device was employed for temperatures up to 1000°C.

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