A Method for Measuring Strain by Analyzing Sharpness of ECP WithImage Analysis | Zendy

Yasunari Yoshitomi | Zendy; K. Ohta | Zendy; Jirou Harase | Zendy; Yozo Suga | Zendy

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A Method for Measuring Strain by Analyzing Sharpness of ECP WithImage Analysis

Author(s) -

Yasunari Yoshitomi,

K. Ohta,

Jirou Harase,

Yozo Suga

Publication year - 1993

Publication title -

texture stress and microstructure

Language(s) - English

Resource type - Journals

eISSN - 1687-5400

pISSN - 1687-5397

DOI - 10.1155/tsm.22.199

Subject(s) - strain (injury) , image (mathematics) , materials science , computer science , computer vision , medicine , anatomy

A method for measuring strain by analyzing sharpness of Electron Channeling Pattern (ECP) with Image analysis has been newly developed. The relative value of sharpness of first-order pseudo-Kikuchi line in ECP is used as a parameter of strain. Strain change of Fe-3.25%Si alloy single crystal and polycrystal during deformation and recrystallization was analyzed by this method. This method was compared with the conventional methods; hardness and line broadening of X-ray. This method can be used for measuring strain in material with any crystal orientation.

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