Automatic EBSP Analysis for Recrystallization Studies
Author(s) -
Dorte Juul Jensen
Publication year - 1993
Publication title -
texture stress and microstructure
Language(s) - English
Resource type - Journals
eISSN - 1687-5400
pISSN - 1687-5397
DOI - 10.1155/tsm.20.55
Subject(s) - recrystallization (geology) , materials science , scattering , electron , computer science , optics , physics , nuclear physics , geology , paleontology
The potential of local texture techniques for investigations of recrystallization are reviewed. The need for automatization of such techniques is discussed. It is shown how orientation measurements using one of these techniques, the electron back scattering pattern (EBSP) technique, can be made fully automatic.
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