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Characterization of Recrystallization Textures in Fe-3% Si Sheets by EBSP: Comparison With X Ray Diffraction
Author(s) -
R. Pénelle,
Thierry Baudin,
Pascal Paillard,
L. Mora
Publication year - 1991
Publication title -
textures and microstructures
Language(s) - English
Resource type - Journals
eISSN - 1026-5406
pISSN - 0730-3300
DOI - 10.1155/tsm.14-18.597
Subject(s) - recrystallization (geology) , x ray , materials science , diffraction , characterization (materials science) , crystallography , x ray crystallography , optics , physics , nanotechnology , chemistry , geology , paleontology

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