Resolution of SuperimposedDiffraction Peaks in Texture Analysisof a YBa2Cu3O7 Polycrystal
Author(s) -
J. S. Kallend,
R. B. Schwarz,
Anthony D. Rollett
Publication year - 1990
Publication title -
texture stress and microstructure
Language(s) - English
Resource type - Journals
eISSN - 1687-5400
pISSN - 1687-5397
DOI - 10.1155/tsm.13.189
Subject(s) - crystallite , texture (cosmology) , materials science , diffraction , orientation (vector space) , superposition principle , resolution (logic) , degeneracy (biology) , condensed matter physics , crystallography , superconductivity , crystal (programming language) , oxide , crystal structure , x ray crystallography , analytical chemistry (journal) , optics , physics , chemistry , image (mathematics) , geometry , metallurgy , mathematics , bioinformatics , quantum mechanics , artificial intelligence , computer science , biology , programming language , chromatography
Texture measurements in polycrystalline 123 oxide superconductors are complicated by the superpositionof Bragg reflections in the pole figures due to the near degeneracy of the crystal structure. Amethod is described, based on an extension of the WIMV algorithm, for resolving thesesuperpositions and determining the crystal orientation distribution (OD). The method is exemplifiedby OD analysis of a magnetically aligned, strongly textured powder sample of YBa 2 Cu 3 O 7 .
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