Texture Analysis by Neutron Diffraction Using a Linear Position Sensitive Detector
Author(s) -
G. Will,
Wolfgang Schäfer,
P. Merz
Publication year - 1989
Publication title -
texture stress and microstructure
Language(s) - English
Resource type - Journals
eISSN - 1687-5400
pISSN - 1687-5397
DOI - 10.1155/tsm.10.375
Subject(s) - texture (cosmology) , neutron diffraction , position (finance) , detector , materials science , diffraction , neutron , neutron detection , crystallography , analytical chemistry (journal) , optics , physics , nuclear physics , chemistry , computer science , artificial intelligence , chromatography , image (mathematics) , finance , economics
Neutron diffraction in connection with a position-sensitive detector is a most powerful technique in texture analysis comparable in time with conventional X-ray laboratory technique. Neutrons measure the global texture of the sample allowing volumes up to several cm3. By using position-sensitive detectors and applying the mathematical procedures of profile analysis multiphase and low symmetry materials can be investigated without serious difficulties. Neutron diffraction experiments operating in transmission record complete diffraction profiles; overlapping lines are unscrambled by profile analysis. Technical and physical specifications of the dedicated detector JULIOS, installed on the texture diffractometer of Bonn University, are given. A hematite ore has been studied by this technique and the results are given.
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