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Reliability Considerations of Flip Chip Components for Automotive Electronic Applications
Author(s) -
Keisuke Sugiyama,
I. Bansaku,
Naoharu Tsuzimoto,
Iwao Tachikawa
Publication year - 1981
Publication title -
active and passive electronic components
Language(s) - English
Resource type - Journals
eISSN - 1026-7034
pISSN - 0882-7516
DOI - 10.1155/apec.9.87
Subject(s) - automotive industry , reliability (semiconductor) , electronics , flip chip , automotive electronics , automotive engineering , electronic component , electronic equipment , electronic systems , reliability engineering , chip , engineering , computer science , electrical engineering , manufacturing engineering , electronic engineering , materials science , nanotechnology , aerospace engineering , power (physics) , physics , adhesive , layer (electronics) , quantum mechanics
Electronic devices for automotive electronic applications have to be operated under extreme environmental conditions and therefore are required to have higher reliability compared with general electronic equipment. Recently automotive voltage regulators, ignition systems, etc. have been changing from mechanical constructions to electronic ones using thick film technology. This paper presents results that shows that our flip chip IC technology can satisfy the high reliability requirements of automobile electronics.

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