Reliability of LED's; Are the Accelerated Ageing Tests Reliable?
Author(s) -
G. Ferenczi
Publication year - 1981
Publication title -
active and passive electronic components
Language(s) - English
Resource type - Journals
eISSN - 1026-7034
pISSN - 0882-7516
DOI - 10.1155/apec.9.239
Subject(s) - reliability engineering , reliability (semiconductor) , ageing , accelerated life testing , computer science , psychology , medicine , engineering , developmental psychology , physics , thermodynamics , power (physics) , maturity (psychological)
The mechanisms, leading to light output degradation of LED's were studied using a number of different techniques e.g. deep level spectroscopy, electroluminescence, minority carrier life time measurements. Several processes were revealed having different temperature and stress current dependence. Using these data extrapolations based on accelerated ageing test results are reexamined.
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