Allowable Power in NiCr Film Resistors | Zendy

T.M. Berlicki | Zendy; Eugeniusz Prociów | Zendy

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Allowable Power in NiCr Film Resistors

Author(s) -

T.M. Berlicki,

Eugeniusz Prociów

Publication year - 1981

Publication title -

active and passive electronic components

Language(s) - English

Resource type - Journals

eISSN - 1026-7034

pISSN - 0882-7516

DOI - 10.1155/apec.9.209

Subject(s) - resistor , resistive touchscreen , nichrome , materials science , sheet resistance , power (physics) , condensed matter physics , electrical engineering , composite material , mechanics , optoelectronics , engineering , voltage , physics , thermodynamics , layer (electronics)

This paper reports the dependence between the power required to cause destruction and the dimensions of resistive films, i.e. the width and thickness. The dependence has been analysed using destruction phenomenon models which consider the increase of temperature of the resistive films and the films defects. Results show that the power value required to cause destruction rises linearly with the width of the resistor films and is exponentially proportional to the sheet resistance.

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