The Anomalous Properties of Polysiloxane Films | Zendy

V. Ryšánek | Zendy

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The Anomalous Properties of Polysiloxane Films

Author(s) -

V. Ryšánek

Publication year - 1981

Publication title -

active and passive electronic components

Language(s) - English

Resource type - Journals

eISSN - 1026-7034

pISSN - 0882-7516

DOI - 10.1155/apec.8.241

Subject(s) - permittivity , capacitor , materials science , humidity , argon , electrical resistivity and conductivity , composite material , thin film , cathode ray , condensed matter physics , electron , optoelectronics , dielectric , thermodynamics , electrical engineering , atomic physics , nanotechnology , physics , quantum mechanics , voltage , engineering

An electron beam was used to create thin polysiloxane films from methylphenylsiloxane and the anomalous properties of permittivity and temperature dependence, the resistivity dependence on humidity and the permittivity dependence on pressure of air or argon, was examined. These anomalous properties can be potentially applicable to humidity probes, pressure gauges and for miniature capacitors.

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