Evaluation of Inhomogeneous Resistive Layers by a Four Point Method | Zendy

György Fodor | Zendy; M. Szilágyi | Zendy; L. Zombory | Zendy

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Evaluation of Inhomogeneous Resistive Layers by a Four Point Method

Author(s) -

György Fodor,

M. Szilágyi,

L. Zombory

Publication year - 1980

Publication title -

active and passive electronic components

Language(s) - English

Resource type - Journals

eISSN - 1026-7034

pISSN - 0882-7516

DOI - 10.1155/apec.7.211

Subject(s) - resistive touchscreen , homogeneous , electrical resistivity and conductivity , sheet resistance , layer (electronics) , materials science , point (geometry) , head (geology) , composite material , mechanics , physics , geology , geometry , engineering , mathematics , electrical engineering , statistical physics , geomorphology

This paper describes the determination of the sheet resistance of a narrow strip located in a homogeneous resistive layer of different resistivity. The application of the method for the evaluation of inhomogeneous layers used for thermoprinter head production is discussed.

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