Open AccessHelium Leak Measurements as a Predictor of Hermetic Package Life in Surgically-implanted Microelectronic Devices
Author(s) -
P. E. K. Donaldson
Publication year - 1980
Publication title -
active and passive electronic components
Language(s) - English
Resource type - Journals
eISSN - 1026-7034
pISSN - 0882-7516
DOI - 10.1155/apec.6.263
Subject(s) - microelectronics , leak , leak detection , materials science , biomedical engineering , engineering , optoelectronics , environmental engineering
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