z-logo
open-access-imgOpen Access
Electrical Transport in Thick Film Resistors
Author(s) -
Robert M. Hill
Publication year - 1980
Publication title -
active and passive electronic components
Language(s) - English
Resource type - Journals
eISSN - 1026-7034
pISSN - 0882-7516
DOI - 10.1155/apec.6.141
Subject(s) - resistor , hindsight bias , solid state , electrical engineering , computer science , engineering physics , physics , engineering , psychology , voltage , cognitive psychology
It is only in the last ten years or so that solid state physics has had the temerity to consider that real solids are neither perfect nor pure, whereas for many years all resistors of reasonable quality have been impure, highly doped, and clearly disordered in structure. As solid state theory has developed there have been attempts to understand the resistor problem but until now, with hindsight, we can say that the tools required have not been available. The situation is, even now, not perfectly clear but there is sufficient information available to make a critical assessment of the methods that can be applied and to indicate where the solution to the problem of carrier transport in resistor materials might lie.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom