Nonlinearity Measurements Using Alternating Current | Zendy

V. Ryšánek | Zendy; Carlo Corsi | Zendy; Arnaldo D’Amico | Zendy

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Nonlinearity Measurements Using Alternating Current

Author(s) -

V. Ryšánek,

Carlo Corsi,

Arnaldo D’Amico

Publication year - 1978

Publication title -

active and passive electronic components

Language(s) - English

Resource type - Journals

eISSN - 1026-7034

pISSN - 0882-7516

DOI - 10.1155/apec.5.91

Subject(s) - alternating current , current (fluid) , nonlinear system , materials science , physics , electrical engineering , engineering , voltage , thermodynamics , quantum mechanics

The nonlinearity measurement technique described uses an adapted conventional lock-in-amplifier. This technique enables us to measure small nonlinearities over a wide frequency band and is more sensitive than the 1/f noise measurement used to detect non-homogeneous structures in conductors, resistors and semiconductor components. Results illustrating uses of this method are presented for different types of resistor and semiconductor structures.

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