Grain Size Dependence of the Gauge Factor of Thin Metallic Films | Zendy

C. R. Tellier | Zendy; A. J. Tosser | Zendy

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Grain Size Dependence of the Gauge Factor of Thin Metallic Films

Author(s) -

C. R. Tellier,

A. J. Tosser

Publication year - 1977

Publication title -

active and passive electronic components

Language(s) - English

Resource type - Journals

eISSN - 1026-7034

pISSN - 0882-7516

DOI - 10.1155/apec.4.9

Subject(s) - crystallite , materials science , monocrystalline silicon , condensed matter physics , transverse plane , scattering , grain boundary , grain size , metal , surface (topology) , gauge (firearms) , strain gauge , boundary (topology) , composite material , physics , optics , mathematics , metallurgy , mathematical analysis , geometry , silicon , structural engineering , microstructure , engineering

The combined effects of grain boundary, external surface and background scattering (Mayadas and Shatzkes model) are considered. Theoretical expressions of the transverse and longitudinal strain coefficient of resistance of monocrystalline and polycrystalline films are calculated. These general formulae agree with those previously proposed for infinitely thick polycrystalline films.

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