Factors Affecting Laser‐Trim Stability of Thick Film Resistors | Zendy

René E Coté | Zendy; R. C. Headley | Zendy; J. T. Herman | Zendy; Arthur T. Howe | Zendy

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Factors Affecting Laser‐Trim Stability of Thick Film Resistors

Author(s) -

René E Coté,

R. C. Headley,

J. T. Herman,

Arthur T. Howe

Publication year - 1977

Publication title -

active and passive electronic components

Language(s) - English

Resource type - Journals

eISSN - 1026-7034

pISSN - 0882-7516

DOI - 10.1155/apec.4.193

Subject(s) - trim , resistor , materials science , laser , stability (learning theory) , optoelectronics , composite material , optics , electrical engineering , engineering , computer science , structural engineering , physics , voltage , machine learning

Various factors affecting precision of trim and resistor stability are considered. The influence of machine operating parameters (beam power, pulse frequency and trim speed) on resistor performance are examined and quantified through statistically designed experiments for a Q-switched YAG laser system. Laser kerf quality is examined by scanning electron microscopy and related to kerf isolation resistance measurements. A relatively simple, production oriented, quality control test is proposed for rapid determination of kerf electrical stability. In addition, the effect of cut design and extent of trim on precision and stability are discussed.

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