Comparison of Arc Erosive and Laser Beam Trimming of Thin FilmResistors | Zendy

Z. Illyefalvi-Vitéz | Zendy

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Comparison of Arc Erosive and Laser Beam Trimming of Thin FilmResistors

Author(s) -

Z. Illyefalvi-Vitéz

Publication year - 1977

Publication title -

active and passive electronic components

Language(s) - English

Resource type - Journals

eISSN - 1026-7034

pISSN - 0882-7516

DOI - 10.1155/apec.4.179

Subject(s) - trimming , resistor , arc (geometry) , materials science , electric arc , laser beams , optics , laser , composite material , electrode , electrical engineering , mechanical engineering , engineering , voltage , physics , quantum mechanics

The physical processes of arc erosive micromachining and the influence of trimming on the parameters of resistors have been examined, and thin film resistors without trimming are compared with those trimmed by arc erosion and laser beam machining. In the paper a theoretical model for arc erosion of thin films is proposed. The optimal conditions of arc erosive trimming are determined. The shape of the cuts are recorded and examined. The applicability of arc erosive trimming with respect to stability is proved. A measuring method is introduced for resistors trimmed by arc erosion using a direct current generator.

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