The Determination of the Thickness of Anodic Al2O3 Film | Zendy

R. Van Schuur | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

The Determination of the Thickness of Anodic Al₂O₃ Film

Author(s) -

R. Van Schuur

Publication year - 1977

Publication title -

active and passive electronic components

Language(s) - English

Resource type - Journals

eISSN - 1026-7034

pISSN - 0882-7516

DOI - 10.1155/apec.3.203

Subject(s) - anodizing , ammonium hydroxide , electrolyte , annealing (glass) , materials science , aluminium , ethylene glycol , analytical chemistry (journal) , ellipsometry , aqueous solution , chemistry , composite material , inorganic chemistry , thin film , nanotechnology , chromatography , electrode , organic chemistry

To compare the properties of anodized aluminium oxide layers an easy thickness determination method is wanted. Crevecoeur and De Wit used a method expressing the thickness in terms of peak voltages obtained by forming again after annealing. The aim of the work described here is to relate the value of the peak voltage to the thickness of the layer measured by ellipsometry.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research