The Influence of Conductor Particle Size Distribution on the Blending Curve of Epoxy-Based Thick Film Resistors
Author(s) -
Bülent Uluğ,
John M. Robertson,
Peter Ewen
Publication year - 1982
Publication title -
active and passive electronic components
Language(s) - English
Resource type - Journals
eISSN - 1026-7034
pISSN - 0882-7516
DOI - 10.1155/apec.10.277
Subject(s) - epoxy , conductor , materials science , resistor , composite material , particle (ecology) , particle size distribution , particle size , electrical engineering , engineering , voltage , oceanography , geology , chemical engineering
The influence of conductor particle size distribution on the blending curve of epoxy-based thick film resistors has been investigated. It was found that the critical volume fraction shifts to higher values as the spread of the conductor particle size distribution decreases. The results are interpreted in terms of a model whose main parameter is the contact probability for the conductor particles.
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