Open AccessOn Wiener Process Degradation Model for Product Reliability Assessment: A Simulation Study
Author(s) -
Herbert Hove,
Farai Mlambo
Publication year - 2022
Publication title -
modelling and simulation in engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.264
H-Index - 20
eISSN - 1687-5591
pISSN - 1687-5605
DOI - 10.1155/2022/7079532
Subject(s) - wiener process , degradation (telecommunications) , reliability (semiconductor) , process (computing) , reliability engineering , computer science , monte carlo method , engineering , mathematics , statistics , physics , telecommunications , power (physics) , quantum mechanics , operating system
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