Encoding Test Pattern of System-on-Chip (SOC) Using Annular Scan Chain | Zendy

Guilin Huang | Zendy; Zhengjin Zhang | Zendy; Honghai Wang | Zendy; Jiabao Jiang | Zendy; Qilin Wu | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Encoding Test Pattern of System-on-Chip (SOC) Using Annular Scan Chain

Author(s) -

Guilin Huang,

Zhengjin Zhang,

Honghai Wang,

Jiabao Jiang,

Qilin Wu

Publication year - 2022

Publication title -

security and communication networks

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.446

H-Index - 43

eISSN - 1939-0114

pISSN - 1939-0122

DOI - 10.1155/2022/6974101

Subject(s) - computer science , test compression , scan chain , encoding (memory) , chip , system on a chip , computer hardware , test data , test (biology) , compression (physics) , compression ratio , algorithm , embedded system , fault coverage , real time computing , parallel computing , integrated circuit , artificial intelligence , telecommunications , electronic circuit , programming language , paleontology , materials science , electrical engineering , internal combustion engine , automotive engineering , composite material , biology , engineering , operating system

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research