Open AccessThe Effect of Bit Depth on High-Temperature Digital Image Correlation Measurements
Author(s) -
Steven R. Jarrett,
Thinh Thai,
Lindsey Rowley,
Weston Craig,
Ryan Berke
Publication year - 2022
Publication title -
journal of sensors
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.399
H-Index - 43
eISSN - 1687-7268
pISSN - 1687-725X
DOI - 10.1155/2022/6554128
Subject(s) - digital image correlation , sample (material) , optics , noise (video) , multiple exposure , range (aeronautics) , digital image , materials science , computer vision , artificial intelligence , computer science , mathematics , image (mathematics) , image processing , physics , composite material , thermodynamics
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