Open AccessDevelopments of Interfacial Measurement Using Cavity Scanning Microwave Microscopy
Author(s) -
Zhenrong Zhang,
Huanfei Wen,
Liangjie Li,
Tao Pei,
Hao Guo,
Zhonghao Li,
Jun Tang,
Jun Liu
Publication year - 2022
Publication title -
scanning
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.359
H-Index - 47
eISSN - 1932-8745
pISSN - 0161-0457
DOI - 10.1155/2022/1306000
Subject(s) - microwave , microwave imaging , materials science , microwave cavity , microscopy , dielectric , semiconductor , optics , scanning probe microscopy , optoelectronics , nanotechnology , computer science , physics , telecommunications
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