Applications of X-Ray Holography
Author(s) -
Bingjun Shi,
Yuan Fu,
Yan Yang
Publication year - 2021
Publication title -
international journal of optics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.263
H-Index - 17
eISSN - 1687-9392
pISSN - 1687-9384
DOI - 10.1155/2021/7711028
Subject(s) - holography , optics , measure (data warehouse) , x ray , computer science , physics , materials science , database
X-ray holography is widely used in material, biology, and industry fields due to its potential to measure the microstructure and dynamic change of objects. In this review, the principle of X-ray holography and the development of this technology in different application fields are systematically summarized and discussed. Through analyzing the advancement of X-ray sources and recording medium, the research and development direction of X-ray holography are prospected and the overview on current strategies of novel X-ray holography is presented. It is proved that X-ray holography, as a powerful nondestructive measurement method, can be applied to a wide range of objects.
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