Reliability Estimation for the Remained Stress-Strength Model under the Generalized Exponential Lifetime Distribution
Author(s) -
Mohammad Mehdi Saber,
M. M. Mohie El-Din,
Haitham M. Yousof
Publication year - 2021
Publication title -
journal of probability and statistics
Language(s) - English
Resource type - Journals
eISSN - 1687-9538
pISSN - 1687-952X
DOI - 10.1155/2021/7363449
Subject(s) - estimator , reliability (semiconductor) , mathematics , exponential distribution , extension (predicate logic) , maximum likelihood , exponential function , stress (linguistics) , statistics , bayes estimator , bayesian probability , estimation , econometrics , mathematical optimization , computer science , engineering , mathematical analysis , power (physics) , physics , linguistics , philosophy , systems engineering , quantum mechanics , programming language
A stress-strength reliability model compares the strength and stresses on a certain system; it is used not only primarily in reliability engineering and quality control but also in economics, psychology, and medicine. In this paper, a novel extension of stress-strength models is presented. The mew model is applied under the generalized exponential distribution. The maximum likelihood estimator, asymptotic distribution, and Bayesian estimation are obtained. A comprehensive simulation study along with real data analysis is performed for illustrating the importance of the new stress-strength model.
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