A Microring Temperature Sensor Based on the Surface Plasmon Wave
Author(s) -
Wenchao Li,
Xiaopeng Sha,
Dongyang An,
Zhiquan Li
Publication year - 2015
Publication title -
advances in optoelectronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.118
H-Index - 21
eISSN - 1687-5648
pISSN - 1687-563X
DOI - 10.1155/2015/696749
Subject(s) - refractive index , optics , surface plasmon resonance , sensitivity (control systems) , materials science , transfer matrix method (optics) , surface plasmon , plasmon , waveguide , wavelength , localized surface plasmon , optoelectronics , surface plasmon polariton , filter (signal processing) , transmission (telecommunications) , physics , electronic engineering , nanotechnology , telecommunications , computer science , nanoparticle , engineering , computer vision
A structure of microring sensor suitable for temperature measurement based on the surface plasmon wave is put forward in this paper. The sensor uses surface plasmon multilayer waveguiding structure in the vertical direction and U-shaped microring structure in the horizontal direction and utilizes SOI as the thermal material. The transfer function derivation of the structure of surface plasmon microring sensor is according to the transfer matrix method. While the change of refractive index of Si is caused by the change of ambient temperature, the effective refractive index of the multilayer waveguiding structure is changed, resulting in the drifting of the sensor output spectrum. This paper focuses on the transmission characteristics of multilayer waveguide structure and the impact on the output spectrum caused by refractive index changes in temperature parts. According to the calculation and simulation, the transmission performance of the structure is stable and the sensitivity is good. The resonance wavelength shift can reach 0.007 μm when the temperature is increased by 100 k and FSR can reach about 60 nm. This structure achieves a high sensitivity in the temperature sense taking into account a wide range of filter frequency selections, providing a theoretical basis for the preparation of microoptics
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