Emission Spectral Control of a Silicon Light Emitting Diode Fabricated by Dressed-Photon-Phonon Assisted Annealing Using a Short Pulse Pair
Author(s) -
Tadashi Kawazoe,
Naoki Wada,
Motoichi Ohtsu
Publication year - 2014
Publication title -
advances in optical technologies
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.124
H-Index - 25
eISSN - 1687-6407
pISSN - 1687-6393
DOI - 10.1155/2014/958327
Subject(s) - phonon , materials science , annealing (glass) , wavelength , laser , diode , photon energy , light emitting diode , silicon , optoelectronics , photon , crystal (programming language) , infrared , optics , analytical chemistry (journal) , physics , condensed matter physics , chemistry , computer science , composite material , programming language , chromatography
We fabricated a high-efficiency infrared light emitting diode (LED) via dressed-photon-phonon (DPP) assisted annealing of a p-n homojunctioned bulk Si crystal. The center wavelength in the electroluminescence (EL) spectrum of this LED was determined by the wavelength of a CW laser used in the DPP-assisted annealing. We have proposed a novel method of controlling the EL spectral shape by additionally using a pulsed light source in order to control the number of phonons for the DPP-assisted annealing. In this method, the Si crystal is irradiated with a pair of pulses having an arrival time difference between them. The number of coherent phonons created is increased (reduced) by tuning (detuning) this time difference. A Si-LED was subjected to DPP-assisted annealing using a 1.3 μm (hν=0.94 eV) CW laser and a mode-locked pulsed laser with a pulse width of 17 fs. When the number of phonons was increased, the EL emission spectrum broadened toward the high-energy side by 200 meV or more. The broadening towards the low-energy side was reduced to 120 meV
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