Optical Response to Submicron Digital Elements Simulated by FDTD Wavelets with Refractive Impulse
Author(s) -
A. J. Bourdillon
Publication year - 2014
Publication title -
advances in optical technologies
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.124
H-Index - 25
eISSN - 1687-6407
pISSN - 1687-6393
DOI - 10.1155/2014/682614
Subject(s) - finite difference time domain method , optics , impulse (physics) , wavelet , phase difference , physics , wavelength , impulse response , plane wave , angle of incidence (optics) , electromagnetic radiation , phase (matter) , computer science , mathematics , mathematical analysis , classical mechanics , quantum mechanics , artificial intelligence
Accurate simulation from digital, submicron, optical elements is obtained by finite difference time domain (FDTD) results that are phase analyzed as sources for Huygens wavelets on fine scales much shorter than the wavelength used. Results, from the MIT electromagnetic evaluation program, are renormalized by a method here called “refractive impulse.” This is valid for polarized responses from digital diffractive and focusing optics. The method is employed with plane wave incidence at any angle or with diverging or converging beams. It is more systematic, more versatile, and more accurate than commercial substitutes
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