Modeling of Temperature-Dependent Noise in Silicon Nanowire FETs including Self-Heating Effects | Zendy

P. Anandan | Zendy; N. Malathi | Zendy; N. Mohankumar | Zendy

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Modeling of Temperature-Dependent Noise in Silicon Nanowire FETs including Self-Heating Effects

Author(s) -

P. Anandan,

N. Malathi,

N. Mohankumar

Publication year - 2014

Publication title -

modelling and simulation in engineering

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.264

H-Index - 20

eISSN - 1687-5591

pISSN - 1687-5605

DOI - 10.1155/2014/635803

Subject(s) - materials science , nanowire , cmos , noise (video) , optoelectronics , silicon nanowires , silicon , nanotechnology , channel (broadcasting) , thermal , electronic engineering , electrical engineering , engineering , physics , computer science , artificial intelligence , meteorology , image (mathematics)

Silicon nanowires are leading the CMOS era towards the downsizing limit and its nature will be effectively suppress the short channel effects. Accurate modeling of thermal noise in nanowires is crucial for RF applications of nano-CMOS emerging technologies. In this work, a perfect temperature-dependent model for silicon nanowires including the self-heating effects has been derived and its effects on device parameters have been observed. The power spectral density as a function of thermal resistance shows significant improvement as the channel length decreases. The effects of thermal noise including self-heating of the device are explored. Moreover, significant reduction in noise with respect to channel thermal resistance, gate length, and biasing is analyzed

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