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Short-Run Control Chart for Multiproducts with Multi-Items Based on Unequal Means and Variances
Author(s) -
Soroush Avakh Darestani,
Neda Aminpour
Publication year - 2014
Publication title -
journal of quality and reliability engineering
Language(s) - English
Resource type - Journals
eISSN - 2314-8047
pISSN - 2314-8055
DOI - 10.1155/2014/458418
Subject(s) - control chart , statistical process control , shewhart individuals control chart , chart , production (economics) , computer science , product (mathematics) , control (management) , reliability engineering , control limits , statistics , process (computing) , ewma chart , engineering , mathematics , artificial intelligence , geometry , economics , macroeconomics , operating system
Statistical process control (SPC) is one of the most important statistical tools for monitoring production processes. It can be effectively designed and implemented when the process or product specifications are consecutively observed from a mass production condition. Normally, short-cycle productions do not have sufficient data to implement SPC. This research introduced how to design and implement short-run control chart for batch production conditions. Monitoring critical specifications of supplied parts to automotive industry was proposed. The results revealed that unequal variables followed normal distribution and can be fluctuated over time for the purpose of monitoring multiple products for each product including multidimensions with unequal means and variances from the central line to control the chart. Out-of-control signals and nonrandom patterns can be recognized on the developed short-run control chart accordingly

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