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Self-Similarity in Transverse Intensity Distributions in the Farfield Diffraction Pattern of Radial Walsh Filters
Author(s) -
Prasun Mukherjee,
Lakshminarayan Hazra
Publication year - 2014
Publication title -
advances in optics
Language(s) - English
Resource type - Journals
eISSN - 2356-6817
pISSN - 2314-7741
DOI - 10.1155/2014/352316
Subject(s) - diffraction , similarity (geometry) , transverse plane , intensity (physics) , plane (geometry) , mathematics , physics , optics , geometry , image (mathematics) , computer science , artificial intelligence , engineering , structural engineering
In a recent communication we reported the self-similarity in radial Walsh filters. The set of radial Walsh filters have been classified into distinct self-similar groups, where members of each group possess self-similar structures or phase sequences. It has been observed that, the axial intensity distributions in the farfield diffraction pattern of these self-similar radial Walsh filters are also self-similar. In this paper we report the self-similarity in the intensity distributions on a transverse plane in the farfield diffraction patterns of the self-similar radial Walsh filters

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